Targeted Analysis
Targeted profiling is based on high mass accuracy measurements (~2 parts per million) using either an Q-Exactive Plus or an IQ-X Orbitrap mass spectrometer, polarity-switch and retention times (RT), the latter established by analyzing standards available in the Center.
‘Super-targeted’ analysis is also available when targeting a limited set of molecules where increased sensitivity and specificity is needed. For such an analysis Selected Ion Monitoring (SIM), Parallel reaction monitoring (PRM) or both is used.
Ion traces are typically extracted using SkyLine, a open-source, user friendly and freely available software developed by the MacCoss Lab at Washington University.
Targeted analysis data extracted using Skyline. From Left to right: molecules in our library, Extracted MS1 signal in positive and negative mode with Explicit retention time marked, MS1 signal for the measured molecule in different samples, Measured retention times of the molecule different samples.
Available standards includes: